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Journal of the Russian Universities. Radioelectronics

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For citations:

Mokrushina S.A., Romanov N.M. Comparison of the MOSFET Response at Exposed of the X-Ray and Gamma Radiation. Journal of the Russian Universities. Radioelectronics. 2020;23(1):30-40. https://doi.org/10.32603/1993-8985-2020-23-1-30-40



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ISSN 1993-8985 (Print)
ISSN 2658-4794 (Online)

ETU, 5F Professora Popova Str., St. Petersburg 197022, Russian Federation
Saint Petersburg Electrotechnical University 
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