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Journal of the Russian Universities. Radioelectronics

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Fedotov S.D., Timoshenkov S.P., Sokolov E.M., Statsenko V.N. The Monitoring of Structural Quality of Silicon-Sapphire Interface by the Surface Photovoltage Method. Journal of the Russian Universities. Radioelectronics. 2017;(5):28-35. (In Russ.)

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ISSN 1993-8985 (Print)
ISSN 2658-4794 (Online)