Methodology for Evaluating Microcontroller Susceptibility to Electromagnetic Influence in TEM Cell

V. A. Semeniuk; M. E. Komnatnov

Journal of the Russian Universities. Radioelectronics
Izvestiya Vysshikh Uchebnykh Zavedenii Rossii. Radioelektronika

ISSN 1993-8985 (Print)
ISSN 2658-4794 (Online)

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Journal of the Russian Universities. Radioelectronics

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Semeniuk V.A., Komnatnov M.E. Methodology for Evaluating Microcontroller Susceptibility to Electromagnetic Influence in TEM Cell. Journal of the Russian Universities. Radioelectronics. 2025;28(6):80-89. (In Russ.) https://doi.org/10.32603/1993-8985-2025-28-6-80-89

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ISSN 1993-8985 (Print)
ISSN 2658-4794 (Online)

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About the Authors

V. A. Semeniuk
Tomsk State University of Control Systems and Radioelectronics
Russian Federation

Valerii A. Semeniuk, Master's degree in "Infocommunication Technologies and Communication Systems" (2022), Postgraduate student of the Department of Television and Control Systems

40, Lenin Ave., Tomsk 634050

M. E. Komnatnov
Tomsk State University of Control Systems and Radioelectronics
Russian Federation

Maxim E. Komnatnov, Cand. Sci. (Eng.) (2016), Associate Professor (2017) of the Department of Television and Management

40, Lenin Ave., Tomsk 634050

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