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Investigation of the Optical Properties of Silicon-on-Insulator Microring Resonators Using Optical Backscatter Reflectometry

https://doi.org/10.32603/1993-8985-2022-25-6-79-89

Abstract

Introduction. Optical backscatter reflectometry is one of the most promising methods used to examine characteristic parameters relevant to the design of microring resonators. This method paves the way for experimental determination of the coupling coefficient and propagation loss. However, experimental verification of this technique by comparing the transmission characteristics obtained by reflectometry and those directly measured by an optical vector analyzer has not been carried out.

Aim. To determine the parameters of microring resonators by optical reflectometry and to calculate on their basis the transmission characteristics of microring resonators. To compare the calculated transmission characteristics with those obtained experimentally using a high-resolution vector analyzer.

Materials and methods. The characteristic parameters of silicon-on-insulator microring resonators were investigated using an ultra-high resolution reflectometer. An original algorithm was employed to derive the characteristic parameters of microring resonators from reflectograms. An optical vector analyzer was used to study the transmission characteristics of microring resonators. Numerical modeling of transmission characteristics considering the obtained parameters was carried out according an analytical approach based on partial wave analysis.

Results. The obtained values of the power coupling coefficient κ = 0.167 and propagation losses α = 3.25 dB/cm were used for numerical simulation of the transmission characteristics of a microring resonator. These characteristics were found to agree well with those obtained experimentally. The free spectral range of 88.8 GHz and Q-factor of 45 000 were determined.

Conclusion. An experimental study of the characteristic parameters of silicon-on-insulator microring resonators was conducted using an optical backscatter reflectometer. The performed comparison of the experimental and theoretical transmission characteristics showed good agreement, which indicates the high accuracy of the determined resonator parameters and, as a result, the relevance of the described method.

About the Authors

I. A. Ryabcev
Saint Petersburg Electrotechnical University
Russian Federation

Ilya A. Ryabcev, Postgraduate Student of the Department of Physical Electronics and Technologies

5 F, Professor Popov St., St Petersburg 197022



A. A. Ershov
Saint Petersburg Electrotechnical University
Russian Federation

Alexander A. Ershov, Postgraduate Student of the Department of Physical Electronics and Technologies

5 F, Professor Popov St., St Petersburg 197022



D. V. Ryaikkenen
Saint Petersburg Electrotechnical University
Russian Federation

Daniil R. Ryaykkenen, 1st year Master Degree Student

5 F, Professor Popov St., St Petersburg 197022



A. P. Burovikhin
Saint Petersburg Electrotechnical University
Russian Federation

Anton P. Burovikhin, Postgraduate Student of the Department of Physical Electronics and Technologies

5 F, Professor Popov St., St Petersburg 197022



R. V. Haponchyk
Saint Petersburg Electrotechnical University
Russian Federation

Roman V. Haponchyk, Postgraduate Student of the Department of Physical Electronics and Technologies

5 F, Professor Popov St., St Petersburg 197022



I. Yu. Tatsenko
Saint Petersburg Electrotechnical University
Russian Federation

Ivan Yu. Tatsenko, Postgraduate Student of the Department of Physical Electronics and Technologies

5 F, Professor Popov St., St Petersburg 197022



A. A. Stashkevich
Université Sorbonne Paris Nord
France

Andrey A. Stashkevich, Dr Sci. (Eng.) (1994), Emeritus Professor (2020) of Institute Galilee, Université Sorbonne Paris Nord, Laboratoire des Sciences des Procedes et des Materiaux (LSPM CNRS)

99, J. B. Clement ave., Villetaneuse 93430



A. A. Nikitin
Saint Petersburg Electrotechnical University
Russian Federation

Andrey A. Nikitin, Can. Sci. (Phys.-Math.) (2011), Docent (2015), Associate Professor of the Department of Physical Electronics and Technologies

5 F, Professor Popov St., St Petersburg 197022



A. B. Ustinov
Saint Petersburg Electrotechnical University
Russian Federation

Alexey B. Ustinov, Dr Sci. (Phys.-Math.) (2012), Docent (2010), Associate Professor of the Department of Physical Electronics and Technologies

5 F, Professor Popov St., St Petersburg 197022



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For citations:


Ryabcev I.A., Ershov A.A., Ryaikkenen D.V., Burovikhin A.P., Haponchyk R.V., Tatsenko I.Yu., Stashkevich A.A., Nikitin A.A., Ustinov A.B. Investigation of the Optical Properties of Silicon-on-Insulator Microring Resonators Using Optical Backscatter Reflectometry. Journal of the Russian Universities. Radioelectronics. 2022;25(6):79-89. (In Russ.) https://doi.org/10.32603/1993-8985-2022-25-6-79-89

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ISSN 1993-8985 (Print)
ISSN 2658-4794 (Online)