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Journal of the Russian Universities. Radioelectronics

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Poltory K.M., Semyonov E.V. Measuring the Nonlinear and Dynamic Characteristics of Baseband Devices with an Overshoot at the Flat Top of Transient Response. Journal of the Russian Universities. Radioelectronics. 2025;28(4):109–118. (In Russ.) https://doi.org/10.32603/1993-8985-2025-28-4-109-118

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ISSN 1993-8985 (Print)
ISSN 2658-4794 (Online)