For citations:
Poltory K.M., Semyonov E.V. Measuring the Nonlinear and Dynamic Characteristics of Baseband Devices with an Overshoot at the Flat Top of Transient Response. Journal of the Russian Universities. Radioelectronics. 2025;28(4):109–118. (In Russ.) https://doi.org/10.32603/1993-8985-2025-28-4-109-118