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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">radioelectronics</journal-id><journal-title-group><journal-title xml:lang="ru">Известия высших учебных заведений России. Радиоэлектроника</journal-title><trans-title-group xml:lang="en"><trans-title>Journal of the Russian Universities. Radioelectronics</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">1993-8985</issn><issn pub-type="epub">2658-4794</issn><publisher><publisher-name>Saint Petersburg Electrotechnical University</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.32603/1993-8985-2022-25-2-74-81</article-id><article-id custom-type="elpub" pub-id-type="custom">radioelectronics-620</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ЭЛЕКТРОНИКА СВЧ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>MICROWAVE ELECTRONICS</subject></subj-group></article-categories><title-group><article-title>Электрически управляемые структуры на основе твердых растворов BaZrxTi1–x O3 и BaSnxTi1–xO3 для СВЧ-применений</article-title><trans-title-group xml:lang="en"><trans-title>Electric Tunable Structures Based on BaZrxTi1–x O3 and BaSnxTi1–xO3 Solid Solutions for Microwave Applications</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0001-9858-3846</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Тумаркин</surname><given-names>А. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Tumarkin</surname><given-names>A. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>кандидат технических наук (1999), доцент (2005), доктор технических наук (2017), профессор кафедры физической электроники и технологии</p><p>ул. Профессора Попова, д. 5 Ф, Санкт-Петербург, 197022, Россия </p><p> </p></bio><bio xml:lang="en"><p> Cand. Sci (Eng.) (1999), Docent (2005), Dr Sci. (Eng.) (2005), Professor at the Department of Physical Electronics and Technology </p><p>5 F, Professor Popov St., St Petersburg 197022, Russia </p></bio><email xlink:type="simple">avtumarkin@yandex.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-1124-4081</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Сапего</surname><given-names>Е. Н.</given-names></name><name name-style="western" xml:lang="en"><surname>Sapego</surname><given-names>E. N.</given-names></name></name-alternatives><bio xml:lang="ru"><p> исследователь (аспирантура, 2021), младший научный сотрудник (2019)</p><p> ул. Профессора Попова, д. 5 Ф, Санкт-Петербург, 197022, Россия</p></bio><bio xml:lang="en"><p> Postgraduate (2021), Researcher Assistant (2019) </p><p>5 F, Professor Popov St., St Petersburg 197022, Russia </p></bio><email xlink:type="simple">ensapego@yandex.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0001-5673-2372</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Гагарин</surname><given-names>А. Г.</given-names></name><name name-style="western" xml:lang="en"><surname>Gagarin</surname><given-names>A. G.</given-names></name></name-alternatives><bio xml:lang="ru"><p> кандидат технических наук (2007), доцент кафедры физической электроники и технологии</p><p>ул. Профессора Попова, д. 5 Ф, Санкт-Петербург, 197022, Россия</p></bio><bio xml:lang="en"><p> Cand. Sci (Eng.) (2007), Associate Professor at the Department of Physical Electronics and Technology </p><p>5 F, Professor Popov St., St Petersburg 197022, Russia </p></bio><email xlink:type="simple">aggagarin@etu.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-8709-6361</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Мухин</surname><given-names>Н. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Mukhin</surname><given-names>N. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p> кандидат технических наук (2014), научный сотрудник </p><p>ул. Магдебургер, д. 50, Бранденбург-на-Гавеле, 14770,Германия</p></bio><bio xml:lang="en"><p> Cand. Sci (Eng.) (2014), Research Officer </p><p>50, Magdeburger St., Brandenburg an der Havel 14770, Germany </p></bio><email xlink:type="simple">mukhin.nikolay.v@gmail.com</email><xref ref-type="aff" rid="aff-2"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru">Санкт-Петербургский государственный электротехнический университет "ЛЭТИ" им. В. И. Ульянова (Ленина)<country>Россия</country></aff><aff xml:lang="en">Saint Petersburg Electrotechnical University<country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru">Университет прикладных наук Бранденбурга<country>Германия</country></aff><aff xml:lang="en">University of Applied Sciences Brandenburg<country>Germany</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2022</year></pub-date><pub-date pub-type="epub"><day>27</day><month>04</month><year>2022</year></pub-date><volume>25</volume><issue>2</issue><fpage>74</fpage><lpage>81</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Тумаркин А.В., Сапего Е.Н., Гагарин А.Г., Мухин Н.В., 2022</copyright-statement><copyright-year>2022</copyright-year><copyright-holder xml:lang="ru">Тумаркин А.В., Сапего Е.Н., Гагарин А.Г., Мухин Н.В.</copyright-holder><copyright-holder xml:lang="en">Tumarkin A.V., Sapego E.N., Gagarin A.G., Mukhin N.V.</copyright-holder><license license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://re.eltech.ru/jour/article/view/620">https://re.eltech.ru/jour/article/view/620</self-uri><abstract><p>Введение. Проведено экспериментальное исследование структурных и электрофизических свойств многокомпонентных пленок твердых растворов титаната-цирконата бария и титаната-станната бария на подложках сапфира. Данные материалы являются альтернативой более исследованному титанату бария-стронция для использования в СВЧ-технике ввиду сравнительно высокой управляемости. В данной статье показано, что при использовании постростового высокотемпературного отжига на подложке формируются пленки с компонентным составом, близким к составу распыляемых мишеней. Определены оптимальные температуры осаждения тонких пленок титаната-цирконата бария и титаната-станната бария для получения наилучших электрофизических параметров.Цель работы. Исследование структурных и СВЧ-свойств BaZrxTi1-xO3 (BZT)- и BaSnxTi1–xO3 (BSnT)-пленок на диэлектрических подложках. Данные сегнетоэлектрические материалы перспективны с точки зрения потерь и нелинейности, а формирование планарных структур на основе этих материалов на диэлектрической подложке позволяет обеспечить существенно больший уровень рабочей мощности СВЧ-устройства.Материалы и методы. Кристаллическая структура и фазовый состав полученных пленок исследовались методом рентгеновской дифракции с помощью дифрактометра ДРОН-6 на эмиссионной спектральной линии CuKα1 (λ = 1.5406 Å). Измерения емкости C и добротности Q = 1/tg δ конденсаторов проводились на частотах 1 и 3 ГГц с помощью резонатора и векторного анализатора HP 8719C.Результаты. Установлено, что высокотемпературный отжиг после осаждения пленки существенно влияет на кристаллическую структуру, фазовый состав пленок и их электрические характеристики. Впервые продемонстрирован низкий уровень диэлектрических потерь планарных емкостных элементов на основе пленок титаната-станната и титаната-цирконата бария в частотном диапазоне 1…60 ГГц при приемлемой управляемости.Заключение. Результаты свидетельствуют о перспективности использования тонких сегнетоэлектрических пленок твердых растворов BaSn0.5Ti0.5O3 и BaZr0.5Ti0.5O3 в устройствах СВЧ-диапазона.</p></abstract><trans-abstract xml:lang="en"><p>Introduction. An experimental study of the structural and electrophysical properties of multicomponent films of solid solutions of barium titanate-zirconate and barium titanate-stannate on sapphire substrates has been carried out. These materials are an alternative to the more studied barium-strontium titanate for use in microwave technology, due to the relatively high controllability. In this paper, it is shown that when using post-post high-temperature annealing, films with a component composition close to the composition of the sprayed targets are formed on the substrate. Optimal deposition temperatures of thin films of barium titanate-zirconate and barium titanate-stannate have been determined to obtain the best electrophysical parameters.Aim. Investigation of structural and microwave properties of BaZrxTi1-xO3 (BZT) and BaSnxTi1–xO3 (BSnT) films on dielectric substrates. These ferroelectric materials are promising in terms of losses and nonlinearity, and the formation of planar structures based on these materials on a dielectric substrate allows for a significantly higher level of operating power of the microwave device.Materials and methods. The crystal structure and phase composition of the obtained films were studied by X-ray diffraction using a DRON-6 diffractometer on the emission spectral line CuKa1 (λ = 1.5406 Å). Capacitance C and Q-factor (Q = 1/tg δ) of capacitors were measured at frequencies of 1 and 3 GHz using a resonator and an HP 8719C vector analyzer.Results. It is established that high-temperature annealing after film deposition has a significant effect on the crystal structure, phase composition of films and their electrical characteristics. For the first time, a low level of dielectric losses of planar capacitive elements based on titanate-stannate and barium titanate-zirconate films in the frequency range of 1…60 GHz with acceptable controllability has been demonstrated.Conclusion. The results obtained indicate the prospects of using thin ferroelectric films of BaSn0.5Ti0.5O3 and BaZr0.5Ti0.5O3 solid solutions in microwave devices.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>сегнетоэлектрические тонкие пленки</kwd><kwd>цирконат-титанат бария</kwd><kwd>станнат-титанат бария</kwd><kwd>высокочастотное магнетронное распыление</kwd><kwd>рентгеновская дифрактометрия</kwd></kwd-group><kwd-group xml:lang="en"><kwd>ferroelectric thin films</kwd><kwd>barium zirconate-titanate</kwd><kwd>barium stannate-titanate</kwd><kwd>high-frequency magnetron sputtering</kwd><kwd>X-ray diffractometry</kwd></kwd-group><funding-group xml:lang="ru"><funding-statement>Работа выполнена в рамках государственного задания Министерства науки и высшего образования Российской Федерации № 075-01024-21-02 от 29.09.2021 (проект FSEE-2021-0014).</funding-statement></funding-group><funding-group xml:lang="en"><funding-statement>The work was supported by the Ministry of Science and Higher Education of the Russian Federation № 075-01024-21-02 dated 29.09.2021 (grant number no. 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