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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">radioelectronics</journal-id><journal-title-group><journal-title xml:lang="ru">Известия высших учебных заведений России. Радиоэлектроника</journal-title><trans-title-group xml:lang="en"><trans-title>Journal of the Russian Universities. Radioelectronics</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">1993-8985</issn><issn pub-type="epub">2658-4794</issn><publisher><publisher-name>Saint Petersburg Electrotechnical University</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.32603/1993-8985-2019-22-4-99-108</article-id><article-id custom-type="elpub" pub-id-type="custom">radioelectronics-359</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ОРИГИНАЛЬНАЯ СТАТЬЯ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>ORIGINAL ARTICLE</subject></subj-group></article-categories><title-group><article-title>Малошумящий программируемый усилитель постоянного тока с дистанционным управлением</article-title><trans-title-group xml:lang="en"><trans-title>Low Noise Programmable DC Amplifier with Remote Control</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0003-0375-904X</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Иванов</surname><given-names>В. Э.</given-names></name><name name-style="western" xml:lang="en"><surname>Ivanov</surname><given-names>Viktor E.</given-names></name></name-alternatives><bio xml:lang="ru"><p>кандидат технических наук (2007), доцент кафедры автоматики и системотехники</p></bio><bio xml:lang="en"><p>Cand. Sci. (Engineering) (1994), Associate Professor of the Department of Automation and system engineering</p></bio><email xlink:type="simple">ivanov72@list.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ен Ун</surname><given-names>Чье</given-names></name><name name-style="western" xml:lang="en"><surname>En Un</surname><given-names>Chye</given-names></name></name-alternatives><bio xml:lang="ru"><p>доктор технических наук (1996), профессор (1997), заведующий кафедрой автоматики и системотехники</p></bio><bio xml:lang="en"><p>Dr. Sci. (Engineering) (1996), Professor (1997), Head of the Department of Automation and Systems Engineering</p></bio><email xlink:type="simple">chye@ais.khstu.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Тихоокеанский государственный университет</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Pacific National University</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2019</year></pub-date><pub-date pub-type="epub"><day>01</day><month>10</month><year>2019</year></pub-date><volume>22</volume><issue>4</issue><fpage>99</fpage><lpage>108</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Иванов В.Э., Ен Ун Ч., 2019</copyright-statement><copyright-year>2019</copyright-year><copyright-holder xml:lang="ru">Иванов В.Э., Ен Ун Ч.</copyright-holder><copyright-holder xml:lang="en">Ivanov V.E., En Un C.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://re.eltech.ru/jour/article/view/359">https://re.eltech.ru/jour/article/view/359</self-uri><abstract><sec><title>Введение</title><p>Введение. В современной технике эксперимента известно направление, связанное с разработкой информационно-измерительных систем регистрации и анализа избыточных низкочастотных шумов. Любой измерительный канал представлен в виде многокаскадной схемы с заданными параметрами каждого каскада, что затрудняет адаптацию измерительной системы к конкретным условиям эксперимента. Решением проблемы является унификация всех компонентов канала, однако при этом одной из основных проблем является оценка собственных шумов электронных элементов, обеспечивающих изменение параметров усилителя.</p></sec><sec><title>Цель работы</title><p> Цель работы. Анализ собственных шумов электронных потенциометров, разработка малошумящего унифицированного усилителя постоянного тока с возможностью внешнего цифрового управления параметрами и исследование его характеристик.</p></sec><sec><title>Материалы и методы</title><p> Материалы и методы. С помощью метода суперпозиции произведен теоретический расчет шумового усиления для каждого компонента неинвертирующего усилителя. Экспериментальные исследования проводились на базе установки, представляющей собой малошумящий усилительный тракт и спектроанализатор на основе модуля сбора данных E14-440 и программного обеспечения «PowerGraph».</p></sec><sec><title>Результаты</title><p> Результаты. По результатам теоретических расчетов шумового усиления для металлопленочных резисторов и экспериментальных исследований характеристик электронных потенциометров показано, что их удельные значения напряжений шумов практически идентичны. Использование цифрового потенциометра в качестве элемента обратной связи и малошумящего источника смещения с двухполярным питанием (AD8400), позволяют реализовать на их основе унифицированный модуль с возможностью каскадирования. Внешнее цифровое управление на основе однокристального микроконтроллера PIC18F2550, разработанного протокола канального уровня «Master-Slave» и ASCII-интерфейса командной строки на базе сети RS-485 позволяет адаптировать его к задачам измерения шумов электронных компонентов, малых токов и напряжений, фликкер-шумов, построения распределенных систем сбора и обработки информации.</p></sec><sec><title>Заключение</title><p> Заключение. Полученные теоретические и практические результаты делают возможным проектирование многоканальных распределенных измерительных систем постоянного тока с адаптацией измерительных каналов к поставленным задачам и возможностями программной коррекции характеристик в реальном времени.</p></sec></abstract><trans-abstract xml:lang="en"><sec><title>Introduction</title><p>Introduction. The developmental direction of information-measuring systems used to record, pre-process and analyse excess low-frequency noise (flicker noise) in modern experimental technology is well known. Every measuring channel is presented in the form of a multistage circuit with specified parameters at each stage. This creates difficulties in adapting a measuring system to specific experimental conditions. While the solution may be to unify all the components of the channel, the problem lies in estimating the intrinsic noise of the electronic elements which provide a change in amplifier parameters.</p></sec><sec><title>Objective</title><p> Objective. To analyse the intrinsic noise of electronic potentiometers. To develop a low-noise unified DC amplifier with the possibility of external digital control parameters. To study the characteristics of a DC amplifier thus developed.</p></sec><sec><title>Materials and methods</title><p> Materials and methods. The superposition method was used to perform theoretical calculation of noise gain for each component of a non-inverting amplifier. Experimental studies were based on a system consisting of a low-noise amplifying path and spectroanalyser using the data acquisition module E14-440. Software "Power-Graph" was used.</p></sec><sec><title>Results</title><p> Results. The results of the theoretical analysis of noise amplification for metal-film resistors and experimental studies of the characteristics of electronic potentiometers indicated that their noise voltages specific values are almost identical. The use of a digital potentiometer as a feedback element and a low-noise bipolar-powered bias source (AD8400) permitted the implementation of a unified module with cascading capability. External digital control was based on a single-chip microcontroller PIC18F2550, using the "Master-Slave" channel level protocol and ASCII-command-line interface based on RS-485 network. This control enabled adaptation for measuring electronic component noise, low currents and voltages, flicker noise and the construction of systems for information collecting and processing.</p></sec><sec><title>Conclusion</title><p> Conclusion. The theoretical and practical results achieved herein enable the design of multichannel distributed DC measuring systems. The systems will offer adaptability for measuring channels to the tasks required, and the possibility of correction of real time characteristics.</p></sec></trans-abstract><kwd-group xml:lang="ru"><kwd>малошумящий предусилитель</kwd><kwd>электронный цифровой потенциометр</kwd><kwd>фильтр на переключаемых конденсаторах</kwd><kwd>усилитель постоянного тока</kwd><kwd>низкочастотный избыточный шум</kwd><kwd>фликкер-шум</kwd></kwd-group><kwd-group xml:lang="en"><kwd>low noise preamplifier</kwd><kwd>electronic digital potentiometer</kwd><kwd>switch capacitor filter</kwd><kwd>DC amplifier</kwd><kwd>lowfrequency excess noise</kwd><kwd>flicker noise</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Chye En Un, Ivanov V. E. Universal Multichannel System for Low Frequency Noise Measurement // Int. 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